| Original language | English |
|---|---|
| Qualification | PhD |
| Awarding Institution |
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| Supervisors/Advisors |
|
| Award date | 7 Jun 2017 |
| Publication status | Published - 2017 |
Keywords
- Scanning probe microscopy
- Scanning near-field microscopy
- Atomic force microscopy
- Surface enhanced Raman spectroscopy
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