Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim; A. Pundt; R. Kirchheim; S.J. van der Molen; E.S. Kooij; J.W.J. Kerssemakers; R.P. Griessen; H. Harms; U. Geyer

doi:10.1063/1.1568153

Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim, A. Pundt, R. Kirchheim, S.J. van der Molen, E.S. Kooij, J.W.J. Kerssemakers, R.P. Griessen, H. Harms, U. Geyer

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Abstract

The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

Original language	English
Pages (from-to)	8958-8965
Number of pages	8
Journal	Journal of Applied Physics
Volume	93
Issue number	11
DOIs	https://doi.org/10.1063/1.1568153
Publication status	Published - 2003

Bibliographical note

Times Cited: 12

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10.1063/1.1568153

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title = "Stress development in thin yttrium films on hard substrates during hydrogen loading",

abstract = "The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.",

author = "M. Dornheim and A. Pundt and R. Kirchheim and {van der Molen}, S.J. and E.S. Kooij and J.W.J. Kerssemakers and R.P. Griessen and H. Harms and U. Geyer",

note = "Times Cited: 12",

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T1 - Stress development in thin yttrium films on hard substrates during hydrogen loading

AU - Dornheim, M.

AU - Pundt, A.

AU - Kirchheim, R.

AU - van der Molen, S.J.

AU - Kooij, E.S.

AU - Kerssemakers, J.W.J.

AU - Griessen, R.P.

AU - Harms, H.

AU - Geyer, U.

N1 - Times Cited: 12

PY - 2003

Y1 - 2003

N2 - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

AB - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

U2 - 10.1063/1.1568153

DO - 10.1063/1.1568153

M3 - Article

SN - 0021-8979

VL - 93

SP - 8958

EP - 8965

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

ER -

Stress development in thin yttrium films on hard substrates during hydrogen loading

Abstract

Bibliographical note

UN SDGs

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