Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim; A. Pundt; R. Kirchheim; S.J. van der Molen; E.S. Kooij; J.W.J. Kerssemakers; R.P. Griessen; H. Harms; U. Geyer

doi:10.1063/1.1568153

Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim
, A. Pundt
, R. Kirchheim
, S.J. van der Molen
, E.S. Kooij
, J.W.J. Kerssemakers
, R.P. Griessen
, H. Harms
, U. Geyer

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Research output: Contribution to Journal › Article › Academic › peer-review

Abstract

The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

Original language	English
Pages (from-to)	8958-8965
Number of pages	8
Journal	Journal of Applied Physics
Volume	93
Issue number	11
DOIs	https://doi.org/10.1063/1.1568153
Publication status	Published - 2003

Bibliographical note

Times Cited: 12

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 7 Affordable and Clean Energy

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10.1063/1.1568153

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title = "Stress development in thin yttrium films on hard substrates during hydrogen loading",

abstract = "The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.",

author = "M. Dornheim and A. Pundt and R. Kirchheim and \{van der Molen\}, S.J. and E.S. Kooij and J.W.J. Kerssemakers and R.P. Griessen and H. Harms and U. Geyer",

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AU - Dornheim, M.

AU - Pundt, A.

AU - Kirchheim, R.

AU - van der Molen, S.J.

AU - Kooij, E.S.

AU - Kerssemakers, J.W.J.

AU - Griessen, R.P.

AU - Harms, H.

AU - Geyer, U.

N1 - Times Cited: 12

PY - 2003

Y1 - 2003

N2 - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

AB - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

U2 - 10.1063/1.1568153

DO - 10.1063/1.1568153

M3 - Article

SN - 0021-8979

VL - 93

SP - 8958

EP - 8965

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 11

ER -

Stress development in thin yttrium films on hard substrates during hydrogen loading

Abstract

Bibliographical note

UN SDGs

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