Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim; A. Pundt; R. Kirchheim; S.J. van der Molen; E.S. Kooij; J.W.J. Kerssemakers; R.P. Griessen; H. Harms; U. Geyer

doi:10.1063/1.1568153

Stress development in thin yttrium films on hard substrates during hydrogen loading

M. Dornheim, A. Pundt, R. Kirchheim, S.J. van der Molen, E.S. Kooij, J.W.J. Kerssemakers, R.P. Griessen, H. Harms, U. Geyer

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Abstract

The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

Original language	English
Pages (from-to)	8958-8965
Number of pages	8
Journal	Journal of Applied Physics
Volume	93
Issue number	11
DOIs	https://doi.org/10.1063/1.1568153
Publication status	Published - 2003

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Times Cited: 12

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This output contributes to the following UN Sustainable Development Goals (SDGs)

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10.1063/1.1568153

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abstract = "The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.",

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AU - Dornheim, M.

AU - Pundt, A.

AU - Kirchheim, R.

AU - van der Molen, S.J.

AU - Kooij, E.S.

AU - Kerssemakers, J.W.J.

AU - Griessen, R.P.

AU - Harms, H.

AU - Geyer, U.

N1 - Times Cited: 12

PY - 2003

Y1 - 2003

N2 - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

AB - The stress development in thin yttrium films during hydrogen loading was analyzed. A linear elastic model was used to predict the behavior of clamped thin films. The results show that the net stress in Y-H films remain comparably small which is the reason for the good mechanical stability of the Y-H switchable mirrors during H cycling.

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JO - Journal of Applied Physics

JF - Journal of Applied Physics

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ER -

Stress development in thin yttrium films on hard substrates during hydrogen loading

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Bibliographical note

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