Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

S. van den Boorn, P.Z. Vroon, M.J. van Bergen

    Research output: Contribution to JournalArticleAcademicpeer-review

    Abstract

    Sample preparation methods for MC-ICP-MS silicon-isotope measurements often involve a cation-exchange purification step. A previous study has argued that this would suffice for geological materials, as the occasional enrichment of anionic species would not compromise silicon-isotope analysis. Here we report significant offsets in MC-ICP-MS silicon-isotope measurements induced by the presence of sulfur. We show that offsets in δ
    Original languageEnglish
    Pages (from-to)1111-1114
    Number of pages4
    JournalJournal of Analytical Atomic Spectrometry
    Volume24
    Issue number8
    Early online date26 May 2009
    DOIs
    Publication statusPublished - 1 Aug 2009

    Fingerprint

    Dive into the research topics of 'Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements'. Together they form a unique fingerprint.

    Cite this