Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

S. van den Boorn; P.Z. Vroon; M.J. van Bergen

doi:10.1039/b816804k

Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

S. van den Boorn
, P.Z. Vroon
, M.J. van Bergen

Research output: Contribution to Journal › Article › Academic › peer-review

Abstract

Sample preparation methods for MC-ICP-MS silicon-isotope measurements often involve a cation-exchange purification step. A previous study has argued that this would suffice for geological materials, as the occasional enrichment of anionic species would not compromise silicon-isotope analysis. Here we report significant offsets in MC-ICP-MS silicon-isotope measurements induced by the presence of sulfur. We show that offsets in δ

Original language	English
Pages (from-to)	1111-1114
Number of pages	4
Journal	Journal of Analytical Atomic Spectrometry
Volume	24
Issue number	8
Early online date	26 May 2009
DOIs	https://doi.org/10.1039/b816804k
Publication status	Published - 1 Aug 2009

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title = "Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements",

abstract = "Sample preparation methods for MC-ICP-MS silicon-isotope measurements often involve a cation-exchange purification step. A previous study has argued that this would suffice for geological materials, as the occasional enrichment of anionic species would not compromise silicon-isotope analysis. Here we report significant offsets in MC-ICP-MS silicon-isotope measurements induced by the presence of sulfur. We show that offsets in δ",

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AU - Vroon, P.Z.

AU - van Bergen, M.J.

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AB - Sample preparation methods for MC-ICP-MS silicon-isotope measurements often involve a cation-exchange purification step. A previous study has argued that this would suffice for geological materials, as the occasional enrichment of anionic species would not compromise silicon-isotope analysis. Here we report significant offsets in MC-ICP-MS silicon-isotope measurements induced by the presence of sulfur. We show that offsets in δ

U2 - 10.1039/b816804k

DO - 10.1039/b816804k

M3 - Article

SN - 0267-9477

VL - 24

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JO - Journal of Analytical Atomic Spectrometry

JF - Journal of Analytical Atomic Spectrometry

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ER -

Sulphur-induced offsets in MC-ICP-MS silicon-isotope measurements

Abstract

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