Thin film substrates from the Raman spectroscopy point of view

L. Gasparov*, T. Jegorel, L. Loetgering, S. Middey, J. Chakhalian

*Corresponding author for this work

Research output: Contribution to JournalArticleAcademicpeer-review

Abstract

We have investigated ten standard single crystal substrates of complex oxides on the account of their applicability in the Raman spectroscopy-based thin film research. In this study, we suggest a spectra normalization procedure that utilizes a comparison of the substrate's Raman spectra to those of well-established Raman reference materials. We demonstrate that MgO, LaGaO 3, (LaAlO3)0.3(Sr2AlTaO 6)0.7 (LSAT), DyScO3, YAlO3, and LaAlO3 can be of potential use for Raman-based thin film research. At the same time TiO2 (rutile), NdGaO3, SrLaAlO4, and SrTiO3 single crystals exhibit multiple phonon modes accompanied by strong Raman background that substantially hinder Raman-based thin film experiments.

Original languageEnglish
Pages (from-to)465-469
Number of pages5
JournalJournal of Raman Spectroscopy
Volume45
Issue number6
DOIs
Publication statusPublished - 1 Jan 2014
Externally publishedYes

Keywords

  • correlated oxide materials
  • Raman spectroscopy
  • thin film substrates

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