Time-, Respondent-, and Interviewer-related Causes of Item-nonresponse on CES-D Depression Scale: A Multilevel Model.

P. van den Eeden, J.H. Smit, A.J. Beekman

Research output: Chapter in Book / Report / Conference proceeding › Conference contribution › Academic › peer-review

Original language	English
Title of host publication	Statistics Canada, Methodology Branch Symposion 96: Non Sampling Errors
Pages	195-205
Number of pages	11
Publication status	Published - 1997

Persistent URL (handle)

@inproceedings{566c0f84ff724c1f9d8c68bb871045b7,

title = "Time-, Respondent-, and Interviewer-related Causes of Item-nonresponse on CES-D Depression Scale: A Multilevel Model.",

author = "{van den Eeden}, P. and J.H. Smit and A.J. Beekman",

year = "1997",

language = "English",

pages = "195--205",

booktitle = "Statistics Canada, Methodology Branch Symposion 96: Non Sampling Errors",

}

Time-, Respondent-, and Interviewer-related Causes of Item-nonresponse on CES-D Depression Scale: A Multilevel Model. / van den Eeden, P.; Smit, J.H.; Beekman, A.J.
Statistics Canada, Methodology Branch Symposion 96: Non Sampling Errors. 1997. p. 195-205.

Research output: Chapter in Book / Report / Conference proceeding › Conference contribution › Academic › peer-review