Trace elements analysis in an optimised set-up for Total Reflection PIXE (TPIXE).

J.A. van Kan, R.D. Vis

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)89
JournalInternational Journal of PIXE
Volume6
DOIs
Publication statusPublished - 1996

Cite this