Skip to main navigation Skip to search Skip to main content

Trace elements analysis in an optimised set-up for Total Reflection PIXE (TPIXE).

  • J.A. van Kan
  • , R.D. Vis

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)89
JournalInternational Journal of PIXE
Volume6
DOIs
Publication statusPublished - 1996

Cite this