Abstract
High-harmonic generation is the frequency upconversion of an intense femtosecond infrared laser in a material. In condensed-phase high-harmonic generation, laser-driven currents of coherently excited charge carriers map the electronic structure onto the emitted light. This promises a thus far scarcely explored potential of condensed-phase time-resolved high-harmonic spectroscopy for probing carrier dynamics. Here, we realize this potential and use time-resolved solid-state high-harmonic spectroscopy from a laser-excited methylammonium lead bromide (MAPbBr3) thin film, a key material in perovskite solar cells, for measuring carrier cooling and relaxation on femto- and picosecond time scales. Through comparison with transient absorption, we show the links between carrier dynamics and experimental observables of generated harmonics.
| Original language | English |
|---|---|
| Pages (from-to) | 10810-10818 |
| Number of pages | 9 |
| Journal | Journal of Physical Chemistry Letters |
| Volume | 14 |
| Issue number | 48 |
| Early online date | 28 Nov 2023 |
| DOIs | |
| Publication status | Published - 7 Dec 2023 |
Bibliographical note
Funding Information:This work has been carried out at the Advanced Research Center for Nanolithography (ARCNL), a public-private partnership of the University of Amsterdam (UvA), the Vrije Universiteit Amsterdam (VU), The Netherlands Organisation for Scientific Research (NWO), and the semiconductor equipment manufacturer ASML, and was partly financed by “Toeslag voor Topconsortia voor Kennis en Innovatie (TKI)” from the Dutch Ministry of Economic Affairs and Climate Policy. The work of J.J.d.B. and B.E. was carried out at the research institute AMOLF, which is part of NWO. P.J. acknowledges funding by the German Research Foundation - SFB1477 “Light-Matter Interaction at Interfaces”, project no. 441234705. We acknowledge support from ERC Starting Grants ANACONDA (Grant No. 101041819) and SHAPE (Grant No. 999624092). The authors acknowledge assistance from the software engineering department and mechanical workshops at AMOLF and ARCNL for construction and implementation of the experimental setup. Furthermore, the authors would like to thank Dr. W.G. Roeterdink for extensive help with the TA measurements. Finally, the authors thank Dr. C.S. Lehmann for technical assistance and Dr. Z. Nie for valuable comments and discussion.
Publisher Copyright:
© 2023 The Authors. Published by American Chemical Society.
Funding
This work has been carried out at the Advanced Research Center for Nanolithography (ARCNL), a public-private partnership of the University of Amsterdam (UvA), the Vrije Universiteit Amsterdam (VU), The Netherlands Organisation for Scientific Research (NWO), and the semiconductor equipment manufacturer ASML, and was partly financed by “Toeslag voor Topconsortia voor Kennis en Innovatie (TKI)” from the Dutch Ministry of Economic Affairs and Climate Policy. The work of J.J.d.B. and B.E. was carried out at the research institute AMOLF, which is part of NWO. P.J. acknowledges funding by the German Research Foundation - SFB1477 “Light-Matter Interaction at Interfaces”, project no. 441234705. We acknowledge support from ERC Starting Grants ANACONDA (Grant No. 101041819) and SHAPE (Grant No. 999624092). The authors acknowledge assistance from the software engineering department and mechanical workshops at AMOLF and ARCNL for construction and implementation of the experimental setup. Furthermore, the authors would like to thank Dr. W.G. Roeterdink for extensive help with the TA measurements. Finally, the authors thank Dr. C.S. Lehmann for technical assistance and Dr. Z. Nie for valuable comments and discussion.
| Funders | Funder number |
|---|---|
| AMOLF | |
| Physics of Nanolithography | |
| Toeslag voor Topconsortia voor Kennis en Innovatie | |
| European Research Council | 101041819, 999624092 |
| Deutsche Forschungsgemeinschaft | SFB1477, 441234705 |
| Universiteit van Amsterdam | |
| Nederlandse Organisatie voor Wetenschappelijk Onderzoek | |
| Ministerie van Economische Zaken en Klimaat |
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