What do we know about the defect types detected in conceptual models?

Maria Fernanda Granda, Nelly Condori-Fernandez, Tanja E.J. Vos, Oscar Pastor

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

Abstract

In Model-Driven Development (MDD), defects are managed at the level of conceptual models because the other artefacts are generated from them, such as more refined models, test cases and code. Although some studies have reported on defect types at model level, there still does not exist a clear and complete overview of the defect types that occur at the abstraction level. This paper presents a systematic mapping study to identify the model defect types reported in the literature and determine how they have been detected. Among the 282 articles published in software engineering area, 28 articles were selected for analysis. A total of 226 defects were identified, classified and their results analysed. For this, an appropriate defect classification scheme was built based on appropriate dimensions for models in an MDD context.
Original languageEnglish
Title of host publication2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS)
Place of PublicationGreece
PublisherIEEE
Pages88-99
Number of pages12
ISBN (Print)9781467366304
DOIs
Publication statusPublished - 19 Jun 2015
EventConference on Research Challenges in Information Science - Greece
Duration: 13 May 201515 May 2015

Conference

ConferenceConference on Research Challenges in Information Science
Period13/05/1515/05/15

Fingerprint

Defects
Software engineering

Keywords

  • Conceptual Schema Defects
  • Defect Classification Scheme
  • Model-Driven Development
  • Systematic Mapping Study

Cite this

Granda, M. F., Condori-Fernandez, N., Vos, T. E. J., & Pastor, O. (2015). What do we know about the defect types detected in conceptual models? In 2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS) (pp. 88-99). [7128867] Greece: IEEE. https://doi.org/10.1109/RCIS.2015.7128867
Granda, Maria Fernanda ; Condori-Fernandez, Nelly ; Vos, Tanja E.J. ; Pastor, Oscar. / What do we know about the defect types detected in conceptual models?. 2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS). Greece : IEEE, 2015. pp. 88-99
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Granda, MF, Condori-Fernandez, N, Vos, TEJ & Pastor, O 2015, What do we know about the defect types detected in conceptual models? in 2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS)., 7128867, IEEE, Greece, pp. 88-99, Conference on Research Challenges in Information Science, 13/05/15. https://doi.org/10.1109/RCIS.2015.7128867

What do we know about the defect types detected in conceptual models? / Granda, Maria Fernanda; Condori-Fernandez, Nelly; Vos, Tanja E.J.; Pastor, Oscar.

2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS). Greece : IEEE, 2015. p. 88-99 7128867.

Research output: Chapter in Book / Report / Conference proceedingConference contributionAcademicpeer-review

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Granda MF, Condori-Fernandez N, Vos TEJ, Pastor O. What do we know about the defect types detected in conceptual models? In 2015 IEEE 9th International Conference on Research Challenges in Information Science (RCIS). Greece: IEEE. 2015. p. 88-99. 7128867 https://doi.org/10.1109/RCIS.2015.7128867