Original language | English |
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Pages (from-to) | 1140-1143 |
Number of pages | 4 |
Journal | Surface and Interface Analysis |
Volume | 42 |
Issue number | 6-7 |
DOIs | |
Publication status | Published - 2010 |
X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering
I.J.T. Jensen, S. Diplas, O. M. Lovvik, J. Watts, S. Hinder, H. Schreuders, B. Dam
Research output: Contribution to Journal › Article › Academic › peer-review