X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

I.J.T. Jensen, S. Diplas, O. M. Lovvik, J. Watts, S. Hinder, H. Schreuders, B. Dam

Research output: Contribution to Journal › Article › Academic › peer-review

Original language	English
Pages (from-to)	1140-1143
Number of pages	4
Journal	Surface and Interface Analysis
Volume	42
Issue number	6-7
DOIs	https://doi.org/10.1002/sia.3347
Publication status	Published - 2010

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title = "X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering",

author = "I.J.T. Jensen and S. Diplas and Lovvik, {O. M.} and J. Watts and S. Hinder and H. Schreuders and B. Dam",

year = "2010",

doi = "10.1002/sia.3347",

language = "English",

volume = "42",

pages = "1140--1143",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "John Wiley and Sons Ltd",

number = "6-7",

}

TY - JOUR

T1 - X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

AU - Jensen, I.J.T.

AU - Diplas, S.

AU - Lovvik, O. M.

AU - Watts, J.

AU - Hinder, S.

AU - Schreuders, H.

AU - Dam, B.

PY - 2010

Y1 - 2010

U2 - 10.1002/sia.3347

DO - 10.1002/sia.3347

M3 - Article

VL - 42

SP - 1140

EP - 1143

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

SN - 0142-2421

IS - 6-7

ER -