X-ray photoelectron spectroscopy study of MgH2 thin films grown by reactive sputtering

I.J.T. Jensen, S. Diplas, O. M. Lovvik, J. Watts, S. Hinder, H. Schreuders, B. Dam

Research output: Contribution to JournalArticleAcademicpeer-review

Original languageEnglish
Pages (from-to)1140-1143
Number of pages4
JournalSurface and Interface Analysis
Volume42
Issue number6-7
DOIs
Publication statusPublished - 2010

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