XUV frequency comb spectroscopy

C. Gohle; D. Z. Kandula; T. J. Pinkert; W. Ubachs; K. S E Eikema

XUV frequency comb spectroscopy

C. Gohle, D. Z. Kandula, T. J. Pinkert, W. Ubachs, K. S E Eikema

Research output: Chapter in Book / Report / Conference proceeding › Conference contribution › Academic › peer-review

Abstract

We report the first demonstration of frequency comb metrology at extreme ultraviolet wavelengths (XUV), based on parametric amplification and high-harmonic generation of frequency comb pulses, which results in an 8-fold improved helium ionization potential.

Original language	English
Title of host publication	International Conference on Ultrafast Phenomena, UP 2010
Publication status	Published - 2010
Event	International Conference on Ultrafast Phenomena, UP 2010 - Snowmass Village, CO, United States Duration: 18 Jul 2010 → 23 Jul 2010

Conference

Conference	International Conference on Ultrafast Phenomena, UP 2010
Country	United States
City	Snowmass Village, CO
Period	18/07/10 → 23/07/10

Access to Document

Fingerprint Dive into the research topics of 'XUV frequency comb spectroscopy'. Together they form a unique fingerprint.

Cite this

@inproceedings{3c41c5cd7caa47dca2a0580be9afeb98,

title = "XUV frequency comb spectroscopy",

abstract = "We report the first demonstration of frequency comb metrology at extreme ultraviolet wavelengths (XUV), based on parametric amplification and high-harmonic generation of frequency comb pulses, which results in an 8-fold improved helium ionization potential.",

author = "C. Gohle and Kandula, {D. Z.} and Pinkert, {T. J.} and W. Ubachs and Eikema, {K. S E}",

year = "2010",

language = "English",

isbn = "9781557528940",

booktitle = "International Conference on Ultrafast Phenomena, UP 2010",

note = "International Conference on Ultrafast Phenomena, UP 2010 ; Conference date: 18-07-2010 Through 23-07-2010",

}

TY - GEN

T1 - XUV frequency comb spectroscopy

AU - Gohle, C.

AU - Kandula, D. Z.

AU - Pinkert, T. J.

AU - Ubachs, W.

AU - Eikema, K. S E

PY - 2010

Y1 - 2010

N2 - We report the first demonstration of frequency comb metrology at extreme ultraviolet wavelengths (XUV), based on parametric amplification and high-harmonic generation of frequency comb pulses, which results in an 8-fold improved helium ionization potential.

AB - We report the first demonstration of frequency comb metrology at extreme ultraviolet wavelengths (XUV), based on parametric amplification and high-harmonic generation of frequency comb pulses, which results in an 8-fold improved helium ionization potential.

UR - http://www.scopus.com/inward/record.url?scp=84897786692&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84897786692&partnerID=8YFLogxK

M3 - Conference contribution

SN - 9781557528940

BT - International Conference on Ultrafast Phenomena, UP 2010

T2 - International Conference on Ultrafast Phenomena, UP 2010

Y2 - 18 July 2010 through 23 July 2010

ER -