zPIE: an autofocusing algorithm for ptychography

Lars Loetgering; Mengqi Du; Kjeld S.E. Eikema; Stefan Witte

doi:10.1364/OL.389492

zPIE: an autofocusing algorithm for ptychography

Lars Loetgering^*, Mengqi Du, Kjeld S.E. Eikema, Stefan Witte

^*Corresponding author for this work

Research output: Contribution to Journal › Article › Academic › peer-review

Abstract

An autofocusing algorithm for ptychography is proposed. The method optimizes a sharpness metric that would be observed in a differential interference microscope and is valid for both amplitude and phase modulating specimens. We experimentally demonstrate that the algorithm, based on the extended ptychographic iterative engine (ePIE), calibrates the sample-detector distance with an accuracy within the depth of field of the ptychographic microscope. We show that the method can be used to determine slice separation in multislice ptychography, provided there are isolated regions on each slice of the specimen that do not axially overlap.

Original language	English
Pages (from-to)	2030-2033
Number of pages	4
Journal	Optics Letters
Volume	45
Issue number	7
Early online date	30 Mar 2020
DOIs	https://doi.org/10.1364/OL.389492
Publication status	Published - 1 Apr 2020

Funding

Nederlandse Organisatie voor Wetenschappelijk Onderzoek (TTW-HTSM 13934); European Research Council (ERC-StG 637476).

Funders	Funder number
Horizon 2020 Framework Programme	637476
European Research Council
Nederlandse Organisatie voor Wetenschappelijk Onderzoek	TTW-HTSM 13934

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abstract = "An autofocusing algorithm for ptychography is proposed. The method optimizes a sharpness metric that would be observed in a differential interference microscope and is valid for both amplitude and phase modulating specimens. We experimentally demonstrate that the algorithm, based on the extended ptychographic iterative engine (ePIE), calibrates the sample-detector distance with an accuracy within the depth of field of the ptychographic microscope. We show that the method can be used to determine slice separation in multislice ptychography, provided there are isolated regions on each slice of the specimen that do not axially overlap.",

author = "Lars Loetgering and Mengqi Du and Eikema, {Kjeld S.E.} and Stefan Witte",

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AU - Du, Mengqi

AU - Eikema, Kjeld S.E.

AU - Witte, Stefan

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AB - An autofocusing algorithm for ptychography is proposed. The method optimizes a sharpness metric that would be observed in a differential interference microscope and is valid for both amplitude and phase modulating specimens. We experimentally demonstrate that the algorithm, based on the extended ptychographic iterative engine (ePIE), calibrates the sample-detector distance with an accuracy within the depth of field of the ptychographic microscope. We show that the method can be used to determine slice separation in multislice ptychography, provided there are isolated regions on each slice of the specimen that do not axially overlap.

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zPIE: an autofocusing algorithm for ptychography

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